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MCT225 offering absolute accuracy for inside geometry This new ‘absolute-accuracy’ Metrology-CT (MCT) system guarantees that all internal and external geometry is measured efficiently. A proprietary liquid cooled micro-focus reflection source and air-cooled cabinet provide long-term stability and enable the MCT225 to achieve an impressive accuracy specification. It offers superior measuring accuracy and small feature detection to inspect precision plastic parts, small castings and complex parts and assemblies. Benefits • 50 years’ experience of Coordinate Measuring Machine (CMM) metrology blended with 25 years’ experience of X-ray Computed Tomography (CT) • Absolute accuracy 9 + L/50 μm in accordance with the VDI/VDE 2630 • Proprietary micro-focus source developed for metrology CT purposes • High-precision mechatronics increase sample manipulation accuracy • Straightforward manual use and automation process flow execution • Powerful visualization and analysis provide detailed insight • Suitable for wide range of sample sizes and material densities. Metrology CT: Non-destructive 3D inspection of internal/external geometry Metrology CT is the fusion of metrology and X-ray Computed Tomography (CT).

X-ray has long been used for industrial applications. With X-ray CT a number of 2D X-ray images are taken at different angles around the sample.

All of the external and internal geometry is captured as the X-rays pass through the sample. Uchebnik tetradj obschaya himiya deryabin ne. CT software constructs a 3D model of the sample using these 2D images.

Dimensional characteristics such as size, position and form can be measured directly using the model as well as full part-to-CAD comparison, section reporting and GD&T analysis. Absolute accuracy of 9μm + L/50 and 2μm feature detectability The MCT225 offers absolute accuracy of 9μm + L/50, and 2μm feature detectability. Absolute Accuracy guarantees measurement accuracy without time consuming comparative scans or reference measurements. Samples are simply placed on a rotary table inside the enclosure and measured. The CT system is pre-calibrated using accuracy standards traceable to the UK’s national measurement institute (NPL) and verified using VDI/VDE 2630 guidelines for Computed Tomography in Dimensional Measurement. A key component of the MCT225 system is the in-house developed Nikon Metrology 225 kV micro-focus X-ray source. It produces incredibly sharp images with low noise levels, enabling magnification levels up to 150x with 2 µm feature detection.

MCT225 is pre-calibrated using accuracy standards traceable to the UK's national measurement institute (NPL) and verified using VDI/VDE 2630 guidelines for Computed Tomography in Dimensional Measurement. “Absolute accuracy” guarantees measurement accuracy without time consuming comparative scans or reference measurements; samples are simply placed on a rotary table inside the enclosure and measured. High-precision mechatronics increase sample manipulation accuracy The MCT225 is equipped with a fully programmable 5-axis precision and large capacity sample manipulator. The manipulator has been optimized through Finite Element Analysis (FEA).